Solar: Fingers. Texture. Color. Wafering Quality. HBLED: PSS. Epi Mesa. Statistics. Automatically. Biotech & MEMS: Tall or deep structures. Multi-surface. Fast & Easy. Your Samples: Very Rough. Very Dark. Curved. Steep. Transparent.
Réseau des Centres Communs de Microscopie, Poitiers, France Colloque SFµ, Nantes, July 2-5, 2013

Zeta Instruments manufactures precision metrology systems that analyze high-roughness, low-reflectance surfaces for Biotech, solar cell, LED, MEMS and other micron-scale measurement applications. Our wide-field optical profilers can measure high-aspect-ratio features from the millimeter to sub-micron range, and film thicknesses down to 30nm. The bundled Zeta 3D imaging software produces true-color 3D feature maps in a fraction of the time of other surface profilers. With available Nomarski/Quantitative-DIC and Film Thickness Measurement options, our systems provide the widest range, highest flexibility and best value in its class.