Zeta Instruments manufactures precision metrology systems that analyze high-roughness, low-reflectance surfaces for Biotech, solar cell, LED, MEMS and other micron-scale measurement applications. Our wide-field optical profilers can measure high-aspect-ratio features from the millimeter to sub-micron range, and film thicknesses down to 30nm. The bundled Zeta 3D imaging software produces true-color 3D feature maps in a fraction of the time of other surface profilers. With available Nomarski/Quantitative-DIC and Film Thickness Measurement options, our systems provide the widest range, highest flexibility and best value in its class.