Zeta Instruments manufactures precision metrology systems that analyze high-roughness, low-reflectance surfaces for Biotech, solar cell, LED, MEMS and other micron-scale measurement applications. Our wide-field optical profilers can measure high-aspect-ratio features from the millimeter to sub-micron range, and film thicknesses down to 30nm. The bundled Zeta 3D imaging software produces true-color 3D feature maps in a fraction of the time of other microscopy systems. With available Nomarski Imaging and Film Thickness Measurement options, our systems provide the widest range, highest flexibility and best value in its class.