Zeta3D™ metrology systems powered by the ZDot™ optical profiler and Multi-Mode Optics are capable of measuring difficult surfaces that white light interferometers and confocal microscopes cannot match.
“We tried using our interferometer to profile an important transparent sample with low-contrast topography, but were unable to focus. With the Zeta optical profiler, we were able to completely characterize the sample in a few minutes.”
– Dr. Antonio J. López –
King Juan Carlos University
“The diversity and speed of the Zeta are unmatched qualities of this system that make it indispensable in the lab. The customer service is fast and helped us even with the most unique and special requests we had, including personal software updates.”
– Florian Stumpf –
Fraunhofer Institute IISB