Macro-AFM
Features too large or too rough for AFM?
Shown above is a inkjet printer component with dimensions beyond the capability of an AFM
Micro-CMM
Features too fine for a CMM?
Shown above is a precision machined microwave channel where the wall angle and other dimensions cannot be measured with a conventional CMM tool
Time to data
In a hurry to measure multiple parameters?
The Zeta tool can image large areas AND provide dimensional, metrology and film related information, all in less than a minute for typical scans
Cost of data
Worried about cost and ROI?
Low initial investment and an even lower cost of maintenance enable cost sensitive applications such as monitoring the etch process in the solar cell wafer process